Wednesday, July 25, 2012

Fundamentals of Mixed Domain Analysis: Testing Your Wireless Design
Are you one of the 38% of design engineers currently working with a wireless-enabled design? With the proliferation of wireless connectivity, today’s designs are forcing engineers to not only verify operation of an integrated RF radio, but to troubleshoot problems across the time and frequency domains. Traditionally, an oscilloscope and spectrum analyzer would have been needed. Synchronizing these two instruments to answer even simple questions was a daunting, if not impossible, task. Enter the Tektronix MDO4000 Series, the world’s only mixed domain oscilloscope, providing engineers with the functionality to analyze time and frequency domains with one instrument.

Location: MetricTest 3486 Investment Blvd- Hayward, CA 94545
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Wednesday, June 27 OR Thursday, June 28:

Agilent Complimentary Digital and RF Workshop
Four advanced, hands-on labs using Agilent's Infiniium 9000 and InfiniiVision 3000 X-Series mixed signal oscilloscopes will allow you to experience debug and analysis capabilities not found in scopes a few short years ago. In addition, you will benefit from learning to choose the right scope probe to deliver the best results for your application.

Agilent Technologies 5301 Stevens Creek Blvd Santa Clara, CA 95051

May 22, 2012:

Granite River Labs & MetricTest Co-Hosted Signal Integrity and Measurement Workshop
Practical DDR3 Signal Integrity Design and Measurement Seminar-This seminar is for engineers who are designing PC boards or DDR3 IO drivers. All of your interconnect design, power plane layout, and setup/hold timing will determine whether your product works or not. It is also important to know the margin of DDR3 system in high volume production. This one-day, advanced DDR3 Signal Integrity class will show you how to design a DDR3 system to improve signal quality, measure the DDR3 system performance, and determine the probability of failure in high volume production.

Location: Granite River Labs, 3500 Thomas Rd, Suite A- Santa Clara, CA 95054

April 18, 2012:

Tektronix & MetricTest Co-Hosted Digital Design Workshop
Debugging Your Digital Design: Fast and Efficiently- Chances are your design includes serial and parallel buses to route data throughout your circuit. Validating that the correct data packets are being transmitted and received on those buses is challenging enough, but what about when things go wrong? Finding the root cause of your problem among thousands of data packets is exhausting without the right tools and techniques.

Location: MetricTest 3486 Investment Blvd- Hayward, CA 94545

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